Nonlinear optical effects of the third order in silicon photonic crystal cavities : High frequency self-induced oscillations and stimulated Raman scattering

In this thesis, we studied third order nonlinear optical effects in photonic crystal cavities. The first of those effects is is the phenomenon of high frequency (GHz) self-pulsing in these cavities, which originates from a modulation of the transmission of the cavity due to the interaction between the free-carrier dispersion and the two-photon absorption. We have observed these self-induced oscillations for the first time in silicon photonic crystal nanocavities, with a frequency of about 3 GHz and a high spectral purity. We have developed a model to analyze the mechanisms that govern the onset of these oscillations, as well as the amplitudes of the fundamental and harmonic frequencies of these oscillations. This self-pulsing phenomenon would allow us to realize realize ultra-compact microwave sources made of silicon. The second phenomenon studied is that of Raman scattering, which is the only way to obtain lasers fully in silicon demonstrated so far. The Raman scattering was measured first in narrow photonic crystals waveguides (W0.63) of length 100 microns, where we could obtain a number of Stokes photons up to 9, showing that the stimulated Raman scattering predominated in these waveguides, although we have not been able to obtain a true Raman laser effect in them. We then measured the Raman scattering in doubly resonant nanocavities specifically designed from these waveguides to optimize the Raman effect, with quality factors up to 235000 for the Stokes resonance. Although we could only measure spontaneous Raman scattering in these cavities, with a Purcell factor of 2.9, the theoretical study that we conducted on the Raman lasers, which agrees perfectly with the experimental results, shows that it would be possible to obtain a Raman laser in these cavities with a threshold below the milliwatt, provided we reduce the losses due to the free-carrier absorption. This could be accomplished by decreasing the free-carrier lifetime, for example by removing the free carriers from the silicon using a MSM junction.

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Source https://theses.hal.science/tel-00924642
Author Cazier, Nicolas
Maintainer CCSD
Last Updated May 7, 2026, 15:13 (UTC)
Created May 7, 2026, 15:13 (UTC)
Identifier NNT: 2013PA112337
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Institut d'électronique fondamentale (IEF) ; Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
creator Cazier, Nicolas
date 2013-12-13T00:00:00
harvest_object_id 07866a49-579b-4770-8434-48f79da0b396
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-31T00:00:00
set_spec type:THESE