The scanning near-field optical microscopy (SNOM) is used to analyze optical phenomena at the sub-wavelength scale such as light localization and propagation in photonic crystals or plasmonic devices. In any case, SNOM experiments rely on the positioning of a local probe in the optical near field of a given structure and on the detection of the surrounding evanescent waves. Depending on the nature of the probe or on the optical detection method, the detected physical properties are the spatial distributions of the amplitude and phase or the intensity of the electric and magnetic components of the probed field. We present here the implementation of an innovative hyperspectral near-field imaging method which aims to detect both spectral and spatial properties of an optical nanosystem at the subwavelength scale. The presented method provides a batch of images over a broad spectral range at visible; near-infrared and telecommunication wavelengths. Using this technique, we report here the near-field observations through the spectrum of the emblematic electromagnetic phenomena involved in photonic crystals and plasmonics such as light waveguiding, trapping or beam shaping
