Scheduling and Advanced Process Control in semiconductor Manufacturing

In this thesis, we discussed various possibilities of integrating scheduling decisions with information and constraints from Advanced Process Control (APC) systems in semiconductor Manufacturing. In this context, important questions were opened regarding the benefits of integrating scheduling and APC. An overview on processes, scheduling and Advanced Process Control in semiconductor manufacturing was done, where a description of semiconductor manufacturing processes is given. Two of the proposed problems that result from integrating bith systems were studied and analyzed, they are :Problem of Scheduling with Time Constraints (PTC) and Problem of Scheduling with Equipement health Factor (PEHF). PTC and PEHF have multicriteria objective functions.PTC aims at scheduling job in families on non-identical parallel machines with setup times and time constraints.Non-identical machines mean that not all miachines can (are qualified to) process all types of job families. Time constraints are inspired from APC needs, for which APC control loops must be regularly fed with information from metrology operations (inspection) within a time interval (threshold). The objective is to schedule job families on machines while minimizing the sum of completion times and the losses in machine qualifications.Moreover, PEHF was defined which is an extension of PTC where scheduling takes into account the equipement Health Factors (EHF). EHF is an indicator on the state of a machine. Scheduling is now done by considering a yield resulting from an assignment of a job to a machine and this yield is defined as a function of machine state and job state.

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Source https://theses.hal.science/tel-00847032
Author Obeid, Ali
Maintainer CCSD
Last Updated May 10, 2026, 06:36 (UTC)
Created May 10, 2026, 06:36 (UTC)
Identifier NNT: 2012EMSE0650
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Département Sciences de la Fabrication et Logistique (SFL-ENSMSE) ; École des Mines de Saint-Étienne (Mines Saint-Étienne MSE) ; Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-CMP-GC
creator Obeid, Ali
date 2012-03-29T00:00:00
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harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-30T00:00:00
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