Reducing the dimensions of transistors increases the soft-errors sensitivity of integrated circuits to energetic particles present in the environments in which they operate. An experiment, presented in this thesis, aiming to study soft-errors sensitivity, in real environment, of SRAM memories issued from two successive technologies, put in evidence the criticality of this thematic. This is to show the need to evaluate circuit's sensitivity to radiation effects, especially commercial circuits that are used more and more for space and avionic applications and even at high altitudes, in order to find the appropriate hardening methodologies. Several fault-injection methods, aiming at evaluating the sensitivity to soft-errors of integrated circuits, were goals for many researches. In this thesis was developed an automated method, and its corresponding tool, allowing the emulation of radiation effects on HDL-based circuits. This method, so-called NETFI (NETlist Fault-Injection), is based on modifying the netlist of the synthesized circuit to allow injecting faults of different types (SEU, SET and Stuck_at). NETFI was applied on different architectures in order to assess its efficiency and put in evidence its capabilities. A study on a fault-tolerant algorithm, so-called self-convergent, executed by a LEON3 processor, was also presented in order to perform an objective comparison between the results issued from NETFI and those issued from another state-of-the-art method, called CEU (Code Emulated Upset).
