Low-Cost Highly-Efficient Fault Tolerant Processor Design for Mitigating the Reliability Issues in Nanometric Technologies
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | https://theses.hal.science/tel-00837746 |
| Author | Yu, H. |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 14:24 (UTC) |
| Created | May 10, 2026, 14:24 (UTC) |
| Identifier | tel-00837746 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Yu, H. |
| date | 2011-12-02T00:00:00 |
| harvest_object_id | 49926fd8-cf0e-46d2-8591-ac1af9399458 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:THESE |