Design Methodology for High-performance Circuits Based on Automatic Optimization Methods.

The aim of this thesis is to establish an efficient analog design methodology, the algorithms and the corresponding design tools which can be employed in the dynamic conception of linear continuous-time (CT) functions. The purpose is to assure that the performance figures for a complete system can be rapidly investigated, but with comparable accuracy to the transistor-level evaluations. A first research direction implied the development of the novel design methodology based on the automatic optimization process of transistor-level cells using a modified Bayesian Kriging approach and the synthesis of robust high-level analog behavioral models in environments like Mathworks – Simulink, VHDL-AMS or Verilog-A.The macro-model extraction process involves a complete set of analyses (DC, AC, transient, parametric, Harmonic Balance) which are performed on the analog schematics implemented on a specific technology process. Then, the extraction and calculus of a multitude of figures of merit assures that the models include the low-level characteristics and can be directly regenerated during the optimization process.The optimization algorithm uses a Bayesian method, where the evaluation space is created by the means of a Kriging surrogate model, and the selection is effectuated by using the expected improvement (EI) criterion subject to constraints.A conception tool was developed (SIMECT), which was integrated as a Matlab toolbox, including all the macro-models extraction and automatic optimization techniques.

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Source https://theses.hal.science/tel-00789352
Author Tugui, Catalin Adrian
Maintainer CCSD
Last Updated May 14, 2026, 10:38 (UTC)
Created May 14, 2026, 10:38 (UTC)
Identifier NNT: 2013SUPL0002
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Supélec Sciences des Systèmes (E3S) ; Ecole Supérieure d'Electricité - SUPELEC (FRANCE)
creator Tugui, Catalin Adrian
date 2013-01-14T00:00:00
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harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-31T00:00:00
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