Decay mechanisms of photoexcited fullerenes from far IR to XUV : velocity map imaging approach

This document presents a study of relaxation mechanisms of fullerenes induced by photoexcitation. We have investigated ionization and fragmentation processes of these model systems under irradiation by various light sources: femtosecond pulse, free electron laser (far IR) and Synchrotron (XUV). To study these mechanisms, we use the velocity map imaging technique which allows us to follow the evolution of the angular distribution and velocity of the emitted particles. The nature of the relaxation mechanisms changes drastically (statistical mechanisms, coherent ionization in strong field, autoionization of plasmons, etc.) depending on the pulse duration, its intensity and the wavelength. Several theoretical approaches have been used including a Weisskopf modelling for the statistical processes and direct treatment of the time dependant Schrödinger equation for the coherent processes. This study allows us building bridges between the relaxation mechanisms occurring on various scales of time

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Source https://theses.hal.science/tel-00678808
Author Cauchy, Cécilia
Maintainer CCSD
Last Updated May 9, 2026, 18:15 (UTC)
Created May 9, 2026, 18:15 (UTC)
Identifier NNT: 2011LYO10164
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire de Spectrométrie Ionique et Moléculaire (LASIM) ; Université Claude Bernard Lyon 1 (UCBL) ; Université de Lyon-Université de Lyon-Centre National de la Recherche Scientifique (CNRS)
creator Cauchy, Cécilia
date 2011-09-30T00:00:00
harvest_object_id 9046960e-b743-47e0-a9d9-9446bd3819b2
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-31T00:00:00
set_spec type:THESE