Robust design of deep-submicron digital circuits

The design of circuits to operate at critical environments, such as those used in control-command systems at nuclear power plants, is becoming a great challenge with the technology scaling. These circuits have to pass through a number of tests and analysis procedures in order to be qualified to operate. In case of nuclear power plants, safety is considered as a very high priority constraint, and circuits designed to operate under such critical environment must be in accordance with several technical standards such as the IEC 62566, the IEC 60987, and the IEC 61513. In such standards, reliability is treated as a main consideration, and methods to analyze and improve the circuit reliability are highly required. The present dissertation introduces some methods to analyze and to improve the reliability of circuits in order to facilitate their qualification according to the aforementioned technical standards. Concerning reliability analysis, we first present a fault-injection based tool used to assess the reliability of digital circuits. Next, we introduce a method to evaluate the reliability of circuits taking into account the ability of a given application to tolerate errors. Concerning reliability improvement techniques, first two different strategies to selectively harden a circuit are proposed. Finally, a method to automatically partition a TMR design based on a given reliability requirement is introduced.

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Source https://pastel.hal.science/pastel-00998731
Author Gonçalves dos Santos Junior, Gutemberg, Goncalves dos Santos Junior
Maintainer CCSD
Last Updated May 5, 2026, 09:53 (UTC)
Created May 5, 2026, 09:53 (UTC)
Identifier NNT: 2012ENST0039
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire Traitement et Communication de l'Information (LTCI) ; Télécom ParisTech-Institut Mines-Télécom [Paris] (IMT)-Centre National de la Recherche Scientifique (CNRS)
creator Gonçalves dos Santos Junior, Gutemberg, Goncalves dos Santos Junior
date 2012-09-06T00:00:00
harvest_object_id f0815164-93e3-46fc-bf2a-0a0376ed191e
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-31T00:00:00
set_spec type:THESE