Advanced Test Methods for SRAMs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 30th IEEE VLSI Test Symposium (VTS) |
| Author | Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud |
| Maintainer | CCSD |
| Last Updated | May 12, 2026, 02:48 (UTC) |
| Created | May 12, 2026, 02:48 (UTC) |
| Identifier | lirmm-00805049 |
| Language | en |
| contributor | Conception et Test de Systèmes MICroélectroniques (SysMIC) ; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Hyatt Maui, HI, United States |
| creator | Bosio, Alberto |
| date | 2012-04-23T00:00:00 |
| harvest_object_id | 8cc9f518-df7e-45a1-b536-0f6ff561761d |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-08-13T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2012.6231070 |
| set_spec | type:COMM |