A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Author | Possamai Bastos, Rodrigo, Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno |
| Maintainer | CCSD |
| Last Updated | May 16, 2026, 22:19 (UTC) |
| Created | May 16, 2026, 22:19 (UTC) |
| Identifier | ISBN: 978-1-4577-1713-0 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Conception et Test de Systèmes MICroélectroniques (SysMIC) ; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Vancouver, Canada |
| creator | Possamai Bastos, Rodrigo |
| date | 2011-10-03T00:00:00 |
| harvest_object_id | 001afff5-9ec8-44ba-b546-bb2d2c721c5b |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-08-13T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/DFT.2011.15 |
| set_spec | type:COMM |