Oxygen intake in ion irradiated fullerene films

Eighteenth International Conference on Ion Beam Analysis, 2007, Hyderabad, India

Data and Resources

Additional Info

Field Value
Source ISSN: 0168-583X
Author Kumar, A., Khan, S.A., Kumar, M., Agarwal, D.C., Singh, Fouran, Tripathi, A., Govind, G., Shivaprasad, S.M., Salomon, J., Pichon, L., Pivin, J.C., Avasthi, D.K.
Maintainer CCSD
Last Updated May 10, 2026, 00:12 (UTC)
Created May 10, 2026, 00:12 (UTC)
Identifier in2p3-00854654
Language en
contributor Semi-conducteurs à large bande interdite (NEEL - SC2G) ; Institut Néel (NEEL) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)
creator Kumar, A.
date 2008-05-10T00:00:00
harvest_object_id 627745e8-5d15-426c-bdff-b78e6255f20c
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-04-08T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1016/j.nimb.2007.12.085
set_spec type:ART