Modelling of the surface-event identification mechanism in Ge detectors equipped with NbSi thin films

A new generation of germanium composite bolometers, equipped with NbSi thin films, has been developed in the framework of the EDELWEISS experiment, presenting impressive surface event identification capabilities and a substantial improvement in the background rejection of heat and ionization detectors. In this work we present a simple thermal model which explain the surface-event identification mechanism via NbSi thin films sensors.