Multi-step damage accumulation in irradiated crystals

This article presents a model of damage accumulation in irradiated crystals. This model is based on the assumption that the damage accumulation occurs through a series of structural transformations triggered by the destabilization of the current structure of crystals. Formal equations describing the damage accumulation build-up and experimental assessment of the model are presented and discussed in the framework of the actual knowledge of radiation effects in oxide crystals (yttria-stabilized zirconia (YSZ) and magnesium-aluminate spinel (MAS)), silicon carbide crystals and zirconia implanted nickel crystals.

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Source ISSN: 0947-8396
Author Jagielski, J., Thome, L.
Maintainer CCSD
Last Updated May 22, 2026, 19:35 (UTC)
Created May 22, 2026, 19:35 (UTC)
Identifier in2p3-00684989
Language en
contributor Institute of Electronic Materials Technology (IEMT) ; Institute of Electronic Materials Technology
creator Jagielski, J.
date 2009-05-22T00:00:00
harvest_object_id b190c5da-bfd3-40fd-9f0a-3986cff1c92b
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-04-08T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1007/s00339-009-5294-z
set_spec type:ART