Low temperature transport spectroscopy of defects using Schottky-barrier MOSFETs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0921-4526 |
| Author | Calvet, L.E., Meshkov, G.A., Strupiechonski, E., Toubestani, D., Snyder, J.P., Fortuna, F., Wernsdorfer, Wolfgang |
| Maintainer | CCSD |
| Last Updated | May 23, 2026, 06:47 (UTC) |
| Created | May 23, 2026, 06:47 (UTC) |
| Identifier | in2p3-00683377 |
| Language | en |
| contributor | Institut d'électronique fondamentale (IEF) ; Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Calvet, L.E. |
| date | 2009-05-23T00:00:00 |
| harvest_object_id | 3d598d47-2933-486a-bf90-fee0b1ca8d89 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-04-08T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.physb.2009.08.319 |
| set_spec | type:ART |