Direct Imaging of p-n Junction in Core-Shell GaN Wires
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1530-6984 |
| Author | Tchoulfian, Pierre, Donatini, Fabrice, Levy, François, Dussaigne, Amélie, Ferret, Pierre, Pernot, Julien |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 09:45 (UTC) |
| Created | May 5, 2026, 09:45 (UTC) |
| Identifier | hal-00999730 |
| Language | en |
| contributor | Semi-conducteurs à large bande interdite (NEEL - SC2G) ; Institut Néel (NEEL) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Tchoulfian, Pierre |
| date | 2014-05-16T00:00:00 |
| harvest_object_id | e587eadf-481a-4db0-b7ac-274ce6eec4a5 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1021/nl5010493 |
| set_spec | type:ART |