Tomographic diffractive microscopy and multiview profilometry with flexible aberration correction

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Source ISSN: 1559-128X
Author Liu, Hui, Bailleul, Jonathan, Simon, Bertrand, Debailleul, Matthieu, Colicchio, Bruno, Haeberlé, Olivier
Maintainer CCSD
Last Updated May 5, 2026, 09:58 (UTC)
Created May 5, 2026, 09:58 (UTC)
Identifier hal-00998064
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Modélisation, Intelligence, Processus et Système (MIPS) ; Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))
creator Liu, Hui
date 2013-01-30T00:00:00
harvest_object_id ffc4971b-9a01-41e6-a2a7-59be2fec6a8a
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2023-04-22T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1364/AO.53.000748
set_spec type:ART