Detailled characterisation of SOI n-FinFETs at very low temperature
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | International Conference on Ultimate Integration on Silicon (ULIS) |
| Author | Achour, H., Cretu, Bogdan, Routoure, Jean-Marc, Carin, Régis, Talmat, Rachida, Benfdila, A., Simoen, E., Claeys, C. |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 10:39 (UTC) |
| Created | May 5, 2026, 10:39 (UTC) |
| Identifier | hal-00994224 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Université Mouloud Mammeri [Tizi Ouzou] = Mouloud Mammeri University of Tizi-Ouzou (UMMTO) |
| coverage | Coventry, United Kingdom |
| creator | Achour, H. |
| date | 2013-03-19T00:00:00 |
| harvest_object_id | badb2eed-66d5-48d4-a6a4-617dced792d0 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-01-24T00:00:00 |
| set_spec | type:COMM |