Low frequency noise characterization in n-channel FinFETs

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Source ISSN: 0038-1101
Author Talmat, Rachida, Achour, H., Cretu, Bogdan, Routoure, Jean-Marc, Benfdila, A., Carin, Régis, Collaert, N., Mercha, A., Simoen, E., Claeys, C.
Maintainer CCSD
Last Updated May 5, 2026, 10:39 (UTC)
Created May 5, 2026, 10:39 (UTC)
Identifier hal-00994184
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Université Mouloud Mammeri [Tizi Ouzou] = Mouloud Mammeri University of Tizi-Ouzou (UMMTO)
creator Talmat, Rachida
date 2012-05-05T00:00:00
harvest_object_id 85090b8d-b227-44ec-9640-fab499d3c4f3
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-02-07T00:00:00
set_spec type:ART