DC and low frequency noise performances of SOI p-FinFETs at very low temperature
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0038-1101 |
| Author | Achour, H., Talmat, Rachida, Cretu, Bogdan, Routoure, Jean-Marc, Benfdila, A., Carin, Régis, Collaert, N., Simoen, E., Mercha, A., Claeys, C. |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 10:39 (UTC) |
| Created | May 5, 2026, 10:39 (UTC) |
| Identifier | hal-00994180 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Université Mouloud Mammeri [Tizi Ouzou] = Mouloud Mammeri University of Tizi-Ouzou (UMMTO) |
| creator | Achour, H. |
| date | 2013-05-05T00:00:00 |
| harvest_object_id | 70025b66-651e-4805-b006-de20d2ac052c |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-01-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2013.06.006 |
| set_spec | type:ART |