Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits |
| Author | dos Santos, S.D., Simoen, E., Strobel, V., Cretu, Bogdan, Routoure, Jean-Marc, Carin, Régis, Aoulaiche, M., Veloso, A., Jurczak, M., Martino, J.A., Claeys, C. |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 10:40 (UTC) |
| Created | May 5, 2026, 10:40 (UTC) |
| Identifier | hal-00994159 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | LSI/PSI/USP - University of Sao Paulo - Brazil ; Universidade de São Paulo = University of São Paulo (USP) |
| coverage | Paris, France |
| creator | dos Santos, S.D. |
| date | 2013-01-22T00:00:00 |
| harvest_object_id | a2cbd38b-f1d2-4e63-97b7-bd607d708eb2 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-01-24T00:00:00 |
| set_spec | type:COMM |