Time-Resolved in situ Synchrotron X-ray Diffraction Studies of Type 1 Silicon Clathrate Formation

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Source ISSN: 0897-4756
Author Hutchins, Peter, T., Leynaud, Olivier, O'Dell, Luke, A., Smith, Mark, E., Barnes, Paul, Mcmillan, Paul
Maintainer CCSD
Last Updated May 5, 2026, 10:53 (UTC)
Created May 5, 2026, 10:53 (UTC)
Identifier hal-00993017
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Department of Chemistry, UCL ; Christopher Ingold Laboratories
creator Hutchins, Peter, T.
date 2011-12-13T00:00:00
harvest_object_id c1bb4f0b-bf3d-4586-b165-8a5681b808d0
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-01-27T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1021/cm2018136
set_spec type:ART