Measurement and modelisation of dielectric properties of ferroelectrics thin layers
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISAF 2010 |
| Author | Renoud, Raphaël, Borderon, Caroline, Gundel, Hartmut, Wolfgang |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 11:09 (UTC) |
| Created | May 5, 2026, 11:09 (UTC) |
| Identifier | hal-00991546 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institut d'Électronique et des Technologies du numéRique (IETR) ; Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Edinburgh, United Kingdom |
| creator | Renoud, Raphaël |
| date | 2010-08-09T00:00:00 |
| harvest_object_id | ff3303f2-63f0-41ea-b844-b26d608bf812 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-03-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/ISAF.2010.5712244 |
| set_spec | type:COMM |