Chapter 8 : Reliability estimation from the junction to packaging of LEDs : Light-Emitting Diodes and Optoelectronics: New Research
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Light-Emitting Diodes and Optoelectronics: New Research |
| Author | Deshayes, Yannick |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 11:37 (UTC) |
| Created | May 5, 2026, 11:37 (UTC) |
| Identifier | hal-00989418 |
| Language | en |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | Deshayes, Yannick |
| date | 2012-05-05T00:00:00 |
| harvest_object_id | 302d7c58-7de6-44c9-b1b0-2d17dd0a0cc7 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| set_spec | type:COUV |