Physical and chemical degradation behavior of sputtered aluminum doped zinc oxide layers for Cu(In,Ga)Se-2 solar cells
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0040-6090 |
| Author | Theelen, Mirjam, Boumans, Twan, Stegeman, Felix, Colberts, Fallon, Illiberi, Andrea, van Berkum, Jurgen, Barreau, Nicolas, Vroon, Zeger, Zeman, Miro |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 11:54 (UTC) |
| Created | May 5, 2026, 11:54 (UTC) |
| Identifier | hal-00988229 |
| Language | en |
| contributor | Thin Film Technology, TNO (TNO) ; The Netherlands Organisation for Applied Scientific Research (TNO) |
| creator | Theelen, Mirjam |
| date | 2014-05-05T00:00:00 |
| harvest_object_id | 361d4f71-1ccb-4afd-99a3-49aa54bbce5a |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-05-07T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tsf.2013.10.149 |
| set_spec | type:ART |