Extraction Procedure for Emitter Series Resistance Contributions in SiGeC BiCMOS Technologies
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | proceeding of IEEE International Conference on Microelectronic Test Structures |
| Author | Stein, F., Huszka, Z., Derrier, N., Maneux, C., Celi, D. |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 12:08 (UTC) |
| Created | May 5, 2026, 12:08 (UTC) |
| Identifier | hal-00987233 |
| Language | en |
| contributor | STMicroelectronics [Crolles] (ST-CROLLES) |
| creator | Stein, F. |
| date | 2014-03-24T00:00:00 |
| harvest_object_id | f1110eaf-b4cb-4035-aaad-c84cf1629e7c |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| set_spec | type:COMM |