Electro-Thermal Investigation and Modeling of Sige Hbt High-Speed Devices
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | SiGe, Ge & Related Compounds: Materials, Processing and Devices |
| Author | Zimmer, Thomas, Weiss, Mario, Maneux, Cristell, Fregonese, Sebastien |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 12:08 (UTC) |
| Created | May 5, 2026, 12:08 (UTC) |
| Identifier | hal-00987211 |
| Language | en |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | Zimmer, Thomas |
| date | 2014-10-05T00:00:00 |
| harvest_object_id | 0acc4cc3-06e5-42b1-baf0-bbbaf5a0c282 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| set_spec | type:COMM |