Prediction of Remaining Useful Life (RUL) of Ball-Grid-Array (BGA) Interconnections during Testing on the Board Level

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Source IEEE Aerospace Conference
Author Gucik-Derigny, David, Zolghadri, Ali, Suhir, E., Bechou, Laurent
Maintainer CCSD
Last Updated May 5, 2026, 12:50 (UTC)
Created May 5, 2026, 12:50 (UTC)
Identifier hal-00984636
Language en
contributor Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
coverage Big Sky, France
creator Gucik-Derigny, David
date 2014-03-01T00:00:00
harvest_object_id 700fa04f-c8b2-4238-b539-537b4c14617d
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-03-17T00:00:00
set_spec type:COMM