Probing the density of states in a metal-oxide-semiconductor field-effect transistor

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Field Value
Source ISSN: 1098-0121
Author Calvet, L.E., Snyder, J.P., Wernsdorfer, Wolfgang
Maintainer CCSD
Last Updated May 5, 2026, 12:55 (UTC)
Created May 5, 2026, 12:55 (UTC)
Identifier hal-00984281
Language en
contributor Institut d'électronique fondamentale (IEF) ; Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
creator Calvet, L.E.
date 2008-11-05T00:00:00
harvest_object_id ba8c3527-e749-4fea-aba4-847aba3c2ae6
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-24T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevB.78.193309
set_spec type:ART