DIAGNOSTIC DE DEFAILLANCES DE SYSTEMES OPTOELECTRONIQUES
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | https://hal.science/hal-00980005 |
| Author | Deshayes, Yannick |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 14:21 (UTC) |
| Created | May 5, 2026, 14:21 (UTC) |
| Identifier | ISBN: 978-613-1-50052-7 |
| Language | fr |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | Deshayes, Yannick |
| date | 2010-05-05T00:00:00 |
| harvest_object_id | e433b445-3dbb-497d-bfe1-d18f423b0414 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| set_spec | type:OUV |