Electro-optic and converse piezoelectric coefficients of epitaxial thin films : GaN grown on Si, and (Sr,Ba)Nb2O6 (SBN) grown on Pt coated MgO (poster)

We report the first measurement of the (r13, r33) Pockels electro-optic coefficients in a SBN thin film and in a GaN thin film grown on silicon. The converse-piezoelectric and electro-absorptive coefficients are simultaneously determined.

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Source Conference on Lasers and Electro-Optics, CLEO 2014, Laser Science to Photonic Applications
Author Cuniot-Ponsard, Mireille, Saraswati, Irma, Ko, Suk-Min, Halbwax, Mathieu, Cho, Yong-Hoon, Dogheche, El Hadj
Maintainer CCSD
Last Updated May 5, 2026, 15:52 (UTC)
Created May 5, 2026, 15:52 (UTC)
Identifier hal-00975792
Language en
contributor Laboratoire Charles Fabry / Manolia ; Laboratoire Charles Fabry (LCF) ; Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
coverage San Jose, CA, United States
creator Cuniot-Ponsard, Mireille
date 2014-05-05T00:00:00
harvest_object_id 6750d6fc-b9fc-49d2-8b6d-f9da7c41adaf
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2024-01-24T00:00:00
set_spec type:COMM