Transient Fault Analysis of CORDIC Processor
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | IEEE International Conference on Electronics, Circuits, and Systems (ICECS) |
| Author | An, Ting, Causo, Matteo, Naviner, Lirida, Matherat, Philippe |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 16:38 (UTC) |
| Created | May 5, 2026, 16:38 (UTC) |
| Identifier | hal-00973764 |
| Language | en |
| contributor | Secure and Safe Hardware (SSH) ; Laboratoire Traitement et Communication de l'Information (LTCI) ; Institut Mines-Télécom [Paris] (IMT)-Télécom Paris ; Institut Mines-Télécom [Paris] (IMT)-Institut Polytechnique de Paris (IP Paris)-Institut Polytechnique de Paris (IP Paris)-Institut Mines-Télécom [Paris] (IMT)-Télécom Paris ; Institut Mines-Télécom [Paris] (IMT)-Institut Polytechnique de Paris (IP Paris)-Institut Polytechnique de Paris (IP Paris) |
| coverage | Séville, Spain |
| creator | An, Ting |
| date | 2012-12-05T00:00:00 |
| harvest_object_id | dc8fb2ed-6cde-4cea-93d1-352f6a204eb0 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-02-04T00:00:00 |
| set_spec | type:COMM |