Error-rate prediction for programmable circuits: methodology, tools and studied cases

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Source SPIE Micro- and Nanotechnology Sensors, Systems, and Applications
Author Velazco, Raoul
Maintainer CCSD
Last Updated May 5, 2026, 16:43 (UTC)
Created May 5, 2026, 16:43 (UTC)
Identifier hal-00973527
Language en
contributor Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)
coverage Baltimore, United States
creator Velazco, Raoul
date 2013-05-29T00:00:00
harvest_object_id a7c318c8-cc18-4925-97b3-c74de3430b6b
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-26T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1117/12.2015391
set_spec type:COMM