Diamond delta-FET
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Materials Research Society Fall Meeting |
| Author | Gheeraert, Etienne, Traoré, Aboulaye, Pernot, Julien, Fiori, Alexandre, Omnès, Franck, Tran Thi, Thu Nhi, Bustarret, Etienne, Guyot, Hervé |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 19:29 (UTC) |
| Created | May 5, 2026, 19:29 (UTC) |
| Identifier | hal-00968263 |
| Language | en |
| contributor | Semi-conducteurs à large bande interdite (NEEL - SC2G) ; Institut Néel (NEEL) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Boston, United States |
| creator | Gheeraert, Etienne |
| date | 2011-11-28T00:00:00 |
| harvest_object_id | 5d74ede2-7d60-4c53-a9a4-659439be3a4f |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| set_spec | type:COMM |