Education of reliability in Microelectronics
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | https://hal.science/hal-00963643 |
| Author | Danto, Y., Verdier, F., Fouillat, P., Bonnaud, Olivier |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 22:05 (UTC) |
| Created | May 5, 2026, 22:05 (UTC) |
| Identifier | hal-00963643 |
| Language | en |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | Danto, Y. |
| date | 2002-05-05T00:00:00 |
| harvest_object_id | 51f66887-d721-4377-9564-180036d5ae65 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-04-04T00:00:00 |
| set_spec | type:OTHER |