Meyer-Neldel parameter as a figure of merit for quality of thin film transistor active layer
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | E-MRS 2002, Spring Meeting Poster |
| Author | Pichon, Laurent, Mercha, A., Routoure, Jean-Marc, Carin, Régis, Mohammed-Brahim, Tayeb, Bonnaud, Olivier |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 01:34 (UTC) |
| Created | May 6, 2026, 01:34 (UTC) |
| Identifier | hal-00958688 |
| Language | en |
| contributor | Institut d'Électronique et des Technologies du numéRique (IETR) ; Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Strasbourg, France |
| creator | Pichon, Laurent |
| date | 2002-06-18T00:00:00 |
| harvest_object_id | c8347f9e-5508-4fe3-9574-ad0a01607bcc |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-12-08T00:00:00 |
| set_spec | type:COMM |