Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0018-9375 |
| Author | Yuan, Shih-Yi, Wu, Yu-Lun, Perdriau, Richard, Liao, Shry-Sann |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 02:03 (UTC) |
| Created | May 6, 2026, 02:03 (UTC) |
| Identifier | hal-00957944 |
| Language | en |
| contributor | Institut d'Électronique et des Technologies du numéRique (IETR) ; Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS) |
| creator | Yuan, Shih-Yi |
| date | 2013-04-06T00:00:00 |
| harvest_object_id | fb3dd755-e346-4bfa-b7b4-69d7aa01f146 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-01-31T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2012.2218285 |
| set_spec | type:ART |