Analysis of carrier injection in Si nanoparticle-SiOx film based MOS devices
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1862-6351 |
| Author | Jacques, Emmanuel, Pichon, Laurent, Labbé, Christophe, Khomenkova, Larysa, Gourbilleau, Fabrice |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 03:14 (UTC) |
| Created | May 6, 2026, 03:14 (UTC) |
| Identifier | hal-00956213 |
| Language | en |
| contributor | Institut d'Électronique et des Technologies du numéRique (IETR) ; Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS) |
| creator | Jacques, Emmanuel |
| date | 2014-02-01T00:00:00 |
| harvest_object_id | 1377e448-428d-4fd4-aa1b-9488ff904d69 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-05-08T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1002/pssc.201300379 |
| set_spec | type:ART |