Horizontal Integration and electrical characterisation of Silicon Nanowire Tunnel FETs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ICONN 2013 |
| Author | Brouzet, V., Salem, B., Periwal, P., Baron, T., Bassani, F., Gentile, P., Ghibaudo, G. |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 03:27 (UTC) |
| Created | May 6, 2026, 03:27 (UTC) |
| Identifier | hal-00955750 |
| Language | en |
| contributor | Laboratoire des technologies de la microélectronique (LTM) ; Université Joseph Fourier - Grenoble 1 (UJF)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Annecy, France |
| creator | Brouzet, V. |
| date | 2013-05-06T00:00:00 |
| harvest_object_id | e02dc9cd-df1f-45d7-a8e7-13b3a1aa78e6 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| set_spec | type:COMM |