Towards a reliability analysis method of wide band gap power electronic components and modules
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | European Microelectronics and Packaging Conference |
| Author | Parent, Guillaume, Massiot, Gregor, Rouet, Vincent, Munier, Catherine, Vidal, Paul-Etienne, Carrillo, Francisco |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 05:30 (UTC) |
| Created | May 6, 2026, 05:30 (UTC) |
| Identifier | hal-00952707 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | EADS Innovation Works [Suresnes] (EADS IW) ; EADS - European Aeronautic Defense and Space |
| coverage | Grenoble, France |
| creator | Parent, Guillaume |
| date | 2013-09-09T00:00:00 |
| harvest_object_id | 7e76bc59-fcde-4438-b72e-d9e9c449c69d |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-23T00:00:00 |
| set_spec | type:COMM |