Process for making a gate for a short channel CMOS transistor structure

Data and Resources

Additional Info

Field Value
Source https://hal.science/hal-00944882
Author Joubert, O., Cunge, G., Foucher, J., Fuard, D., Bonvalot, M., Vallier, L.
Maintainer CCSD
Last Updated May 6, 2026, 21:02 (UTC)
Created May 6, 2026, 21:02 (UTC)
Identifier Patent N°: WO0205336
Language en
contributor Laboratoire des technologies de la microélectronique (LTM) ; Université Joseph Fourier - Grenoble 1 (UJF)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)
creator Joubert, O.
date 2004-11-01T00:00:00
harvest_object_id 949db7f4-d22f-46a2-b3f0-9e79347d4759
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-09-27T00:00:00
set_spec type:PATENT