Growth and Characterization of Si/SiGe Axial NWs for TFET application
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | E- Materials Research Society, Fall Meeting |
| Author | Periwal, P., Baron, T., Bassani, F., Latu-Romain, L., Salem, B., Rosaz, G., Potié, A. |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 00:19 (UTC) |
| Created | May 7, 2026, 00:19 (UTC) |
| Identifier | hal-00944270 |
| Language | en |
| contributor | Laboratoire des technologies de la microélectronique (LTM) ; Université Joseph Fourier - Grenoble 1 (UJF)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | warsaw, Russia |
| creator | Periwal, P. |
| date | 2013-09-07T00:00:00 |
| harvest_object_id | abb70a56-933d-4054-bd0c-0213a869e439 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| set_spec | type:COMM |