Elaboration and Characterization of Interfacial Abruptness in Si/SiGe Heterostructured Nanowires obtained by VLS-CVD Method
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Nanowire Growth |
| Author | Periwal, P., Baron, T., Patriarche, G., Mariolle, D., Chevalier, N., Brouzet, V., Latu-Romain, L., Salem, B., Bassani, F. |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 00:36 (UTC) |
| Created | May 7, 2026, 00:36 (UTC) |
| Identifier | hal-00944264 |
| Language | en |
| contributor | Laboratoire des technologies de la microélectronique (LTM) ; Université Joseph Fourier - Grenoble 1 (UJF)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Lausanne, Switzerland |
| creator | Periwal, P. |
| date | 2013-06-07T00:00:00 |
| harvest_object_id | b6715ee7-a495-4a16-a45b-67a7b2089290 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| set_spec | type:COMM |