Characterization of Changes in LDO Susceptibility after Electrical Stress
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0018-9375 |
| Author | Wu, Jianfei, Boyer, Alexandre, Li, Jiancheng, Ben Dhia, Sonia, Shen, Rongjun |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 05:27 (UTC) |
| Created | May 7, 2026, 05:27 (UTC) |
| Identifier | hal-00937780 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | National University of Defense Technology [China] |
| creator | Wu, Jianfei |
| date | 2013-10-07T00:00:00 |
| harvest_object_id | cd736705-fbae-40eb-a882-8c60bca5a427 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-12-12T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2013.2242471 |
| set_spec | type:ART |