Electronic properties of E3 electron trap in n-type ZnO
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0370-1972 |
| Author | Chicot, Gauthier, Pernot, Julien, Santailler, Jean-Louis, Chevalier, Céline, Granier, Carole, Ferret, Pierre, Ribeaud, Alexandre, Feuillet, Guy, Muret, Pierre |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 06:01 (UTC) |
| Created | May 7, 2026, 06:01 (UTC) |
| Identifier | hal-00936922 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Semi-conducteurs à large bande interdite (NEEL - SC2G) ; Institut Néel (NEEL) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Chicot, Gauthier |
| date | 2014-01-07T00:00:00 |
| harvest_object_id | 6feaa7ae-8daf-49c6-a2a1-969542055e77 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1002/pssb.201349261 |
| set_spec | type:ART |