Comparison between TCAD simulated and measured carrier lifetimes in CMOS photodiodes using the Open Circuit Voltage Decay method
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0038-1101 |
| Author | Marcelot, Olivier, Magnan, Pierre |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 06:40 (UTC) |
| Created | May 7, 2026, 06:40 (UTC) |
| Identifier | hal-00935974 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Département Electronique, Optronique et Signal (DEOS) ; Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO) |
| creator | Marcelot, Olivier |
| date | 2013-03-07T00:00:00 |
| harvest_object_id | 29907065-8cb0-4882-aed3-c44dfb1ba56d |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-02-20T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2012.11.005 |
| set_spec | type:ART |