Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0304-3991 |
| Author | Schwartz, Gustavo Ariel, Riedel, Clément, Arinero, Richard, Tordjeman, Philippe, Alegría, Angel, Colmenero, Juan |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 08:01 (UTC) |
| Created | May 7, 2026, 08:01 (UTC) |
| Identifier | hal-00933984 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Centro de Fisica de Materiales (CFM) ; Consejo Superior de Investigaciones Cientificas [España] = Spanish National Research Council [Spain] (CSIC)-Universidad del País Vasco [Espainia] / Euskal Herriko Unibertsitatea [España] = University of the Basque Country [Spain] = Université du pays basque [Espagne] (UPV / EHU) |
| creator | Schwartz, Gustavo Ariel |
| date | 2011-07-07T00:00:00 |
| harvest_object_id | 9ea22194-e170-432d-9fb6-498e0f128d9f |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-10-22T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.ultramic.2011.05.001 |
| set_spec | type:ART |