Fault Rate Analysis: Breaking Masked AES Hardware Implementations Efficiently
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1057-7130 |
| Author | Wang, An, Chen, Man, Wang, Zongyue, Wang, Xiaoyun |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 16:59 (UTC) |
| Created | May 7, 2026, 16:59 (UTC) |
| Identifier | hal-00922227 |
| Language | en |
| contributor | Institute for Advanced Study [Tsinghua] ; Qing hua da xue = Tsinghua University = Université Tsinghoua [Beijing] (THU) |
| creator | Wang, An |
| date | 2013-07-16T00:00:00 |
| harvest_object_id | 196985bc-5779-404b-b6ac-3cd1d2540685 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-11T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TCSII.2013.2268379 |
| set_spec | type:ART |