Dielectric breakdown characteristics studied by scanning probe microscopy under ultrahigh vacuum
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Workshop Functional oxides for integration in micro‐ and nano‐electronics |
| Author | Kogelschatz, M., Foissac, R., Blonkowski, S., Delcroix, P., Sire, C. |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 19:13 (UTC) |
| Created | May 7, 2026, 19:13 (UTC) |
| Identifier | hal-00919194 |
| Language | en |
| contributor | Laboratoire des technologies de la microélectronique (LTM) ; Université Joseph Fourier - Grenoble 1 (UJF)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Autrans, France |
| creator | Kogelschatz, M. |
| date | 2013-04-07T00:00:00 |
| harvest_object_id | 88daf0e3-e5f1-4c82-b57d-4f756407066a |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| set_spec | type:COMM |