Predicting the steady state thickness of passive films with the Point Defect Model in fretting corrosion experiments // Prévision de l'épaisseur du film passif d'un acier inoxydable 316L soumis au fretting corrosion grâce au Point Defect Model, PDM

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Source ISSN: 2261-236X
Author Geringer, Jean, Macdonald, Digby D., Taylor, Mathew, L.
Maintainer CCSD
Last Updated May 8, 2026, 02:16 (UTC)
Created May 8, 2026, 02:16 (UTC)
Identifier hal-00909635
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Centre Ingénierie et Santé (CIS-ENSMSE) ; École des Mines de Saint-Étienne (Mines Saint-Étienne MSE) ; Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)
coverage Villeneuve d'Asq, France
creator Geringer, Jean
date 2013-10-29T00:00:00
harvest_object_id 2d88f428-93d2-42ff-b4f2-8bdd44c62a90
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-04-23T00:00:00
relation info:eu-repo/semantics/altIdentifier/arxiv/1311.7224
set_spec type:COMM