Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0304-3991 |
| Author | Riedel, C., Schwartz, Gustavo Ariel, Arinero, Richard, Tordjeman, Philippe, Lévêque, Gérard, Alegría, Angel, Colmenero, Juan |
| Maintainer | CCSD |
| Last Updated | May 8, 2026, 02:22 (UTC) |
| Created | May 8, 2026, 02:22 (UTC) |
| Identifier | hal-00909492 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institut d’Electronique et des Systèmes (IES) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Riedel, C. |
| date | 2010-05-08T00:00:00 |
| harvest_object_id | dd45d344-f976-4916-b46c-d7fc43b0e600 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-10-22T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.ultramic.2010.02.024 |
| set_spec | type:ART |